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Dr. Chapman's area of research has centered on four areas: the building of Large Area Restructurable Silicon Systems (LARSS), studying techniques for building large area systems and the design of new classes wafer scale type devices, development of new transducers, creating new microfabrication/micromachining techniques with lasers and the application of embedded microprocessor systems. Current research projects includes: Laser applications for IC redundancy in building Wafer Scale Integration - LARSS, laser applications in micromachining, using micromachining techniques to create new sensors/actuators, large area applications in both Wafer Scale Integration circuits and transducer arrays, large area/Wafer Scale Integration Field Programmable Gate Arrays & Custom Computers, laser applications to semiconductor processing, microfabrication technology, Orbital Microfabrication, laser applications to medical measurements for diagnosis and surgical correction, embedded microprocessor systems, and computer Anti-Theft technology.
G.H. Chapman, Laser Applications to IC Defect Correction, accepted by SPIE Photonics West: Lasers as Tools for Manufacturing of Durable Goods and Microelectronics, San Jose, 1998. G.H. Chapman, and D.E. Bergen, A High Speed Lensless Integrated Proximity Sensor, accepted by IEEE Int'l Conf. on Innovative Systems in Silicon, October 1997. G.H. Chapman and Benoit Dufort, Laser Defect Correction Application to FPGA Based Custom Computers, Proceedings Custom Computers Conference (FCCM'97), 1997. T.S.S. Samara, D.E. Bergen, G.H. Chapman, A Laser Micromachined Proximity and Imaging sensor, accepted for Microelectronic Systems Journal, 1997. Y. Audet and G.H. Chapman, Effects of Scanning and Biasing Circuit Restructuring on the Calibration of Large Area Magnetic Field Sensor Array, accepted for IEEE Tran. on VLSI Systems (22 manuscript pages), 1997. Y. Audet and G.H. Chapman, Robust Design of a Large Area Magnetic Field Sensor Array, accepted by IEEE Tran. on VLSI Systems, March 1997. G.H. Chapman and B. Dufort, Laser Correcting Defects to Create Transparent Routing for Large Area FPGA's, Procceedings ACM/SIGDA Int. Symposium on FPGA'97, pg 17-24, Monterey CA, February 1997. G.H. Chapman, N. Sawadsky and P.P.S. Juneja, Phase sensitive techniques applied to a micromachined vacuum sensor, SPIE Micromachined Devices and Components Conf., SPIE Proceedings v 2882, pg 266-277, Austin, TX, October 1996. G.H. Chapman and B. Dufort, Making Defect Avoidance Nearly Invisible to the User in Wafer Scale Field Programmable Gate Arrays, Proceedings IEEE International Symposium on Defect and Fault Tolerence in VLSI Systems, pg 11-19, Boston, MA, November 1996. Y. Audet and G.H. Chapman, Effects of Scanning and Biasing Circuit Restructuring on the Calibration of Large Area Magnetic Field Sensor Array, Proceedings IEEE Int'l Conf. on Innovative Systems in Silicon 1996, pg 61-70, Austin, TX, October 1996. G.H. Chapman, D.E. Bergen, T. Singh and T.S. Weeks, Laser Hole Drilling in Thick Polypropylene sheets for Proximity Sensors, Lasers as Tools for Manufacturing of Durable Goods and Microelectronics, San Jose, SPIE Proceedings v2703, pg 421-429, 1996. B. Dufort and G.H. Chapman, Test Vehicle for a Wafer-Scale Field Programmable Gate Array, IEEE Trans. on Components Packaging and Manuf. Technology - Part B, V. 18, 431-437, 1995. M.J. Syrzycki, G.H. Chapman and M. Parameswaran, Integrated Transducer Systems, Proceedings SPIE, V. 2634, 2-15, 1995. G.H. Chapman, D.E. Bergen and K. Fang, Wafer-Scale Integration Defect Avoidance Tradeoffs Between Laser Links and Omega Network Switching, accepted by Int. Workshop on Defect and Fault Tolerance, Lafayette, LA, 1995. Y. Audet and G.H. Chapman, Robust Design of a Large Area Magnetic Field Sensor Array, Proc. IEEE Int. Conf. on Wafer-Scale Integration '95, 207-216, San Francisco, 1995. B. Dufort and G.H. Chapman, Test Vehicle for a Wafer-Scale Field Programmable Gate Array, Proc. IEEE Int. Conf. on Wafer-Scale Integration '95, 33-42, San Francisco, 1995.
G. Chapman and G Immega, 'Vision System and Proximity Detector', Patent Cooperation Treaty international patent application (assigned to Canadian Space Agency) July 24, 1997. G. Chapman and G Immega, 'Vision System and Proximity Detector', USA patent application allowed (assigned to Canadian Space Agency) 1997. G. Chapman and G Immega, 'Vision System and Proximity Detector', Canadian patent application (assigned to Canadian Space Agency) 1997. G.H. Chapman and T.O. Herndon, 'Selectively Programmable Interconnections in Multilayer Integrated Circuits', U.S.A. Patent number 5,087,589 issued Feb. 11, 1993. T.O. Herndon, and G.H. Chapman, 'Fabrication of Interlayer Conductive Paths in Integrated Circuits', Canadian Patent number 1286795, issued Jul 23 1991. T.O. Herndon, and G.H. Chapman, 'Fabrication of Interlayer Conductive Paths in Integrated Circuits', U.S.A. Patent 4,843,034 issued Jun. 27, 1989. J.I. Raffel, J.A. Yasaitis, G.H. Chapman, M. L. Naiman, and J. A. Burns, 'Method of Forming Conductive Path by Low Power Laser Pulse', U.S.A. Patent 4,810,663 issued Mar. 7, 1989. J.I. Raffel, J.A. Yasaitis, and G.H. Chapman, 'Method and Apparatus for Forming Low Resistance Lateral Links in a Semiconductor Device', U.S.A. Patent 4,636, 404 issued Jan. 13, 1987. * This Patent has been licensed by Lightspeed Semiconductor, a startup company whose main product is based on this process. MIT and the inventors are receiving equity in the company and cash payments for its use. J.I. Raffel, J.A. Yasaitis, and G.H. Chapman, 'Method of Making A Conductive Path in Multi-Layer Metal Structures by Low Power Laser Beam', U.S.A. Patent 4,585,490 issued Apr. 29, 1986.
Kinetic Sciences Inc., Vancouver, B.C.
NSERC Operating grants
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Personal Webpage http://fas.sfu.ca/ensc/people/faculty/chapman/
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Glenn Chapman |
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